Call for papers
Following the tradition of Optical Network Design and Modeling conference, ONDM 2013 will focus on cutting-edge, state-of-the-art research in optical networking, as well as topics relating optical networking to the other areas and disciplines, such as integration of optical and wireless networks or the role of optical network for the future Internet design.
The scope of the conference includes but is not limited to the following topics:
· Optical network performance modeling
· Optical networks for future Internet design
· Optical network control and management
· Energy efficiency in optical networks
· Optical network survivability
· Novel architectures for optical routers and switches
· Optical networks to support cloud computing
· Optical access network architectures and protocols
· Techno-economic analysis of optical networks
· High speed optical LANs and Gigabit Ethernet
· Field trials, new applications and experiments in optical networking
· Convergence of optical and wireless networks
· Security and privacy in optical networks
Authors are encouraged to submit full papers describing original, previously unpublished research results, not currently under review by another conference or journal, addressing state-of-the-art research and development in the area of optical network design and modeling.
IMPORTANT DATES
Submission Deadline: 30 November 2012 21 December 2012
Acceptance Notification: 31 January 2013
Camera Ready Submission: 15 February 2013 20 February 2013
Conference Dates: 16-19 April 2013
REQUIREMENTS
- Authors must submit their paper(s) and/or poster(s) using the EDAS online application no later than December 21, 2012 (extended deadline).
- All papers must be submitted as PDF files, which should not exceed 6 pages in double-column IEEE proceedings style. Accepted papers will be included in the conference proceedings and published in IEEE Xplore digital library. Therefore, all papers must exactly fulfill the IEEE publication requirements in the final submitted version. For paper templates and further instructions, please consult the IEEE Author Digital Toolbox.